Bilt.iTest.easystress.ATE.programmable power supply.programmable power supplies.alimentation programmable.alimentations programmables.GPIB.SCPI.stress.burnin.burn-in.lifetest.life-test.etuve.etuves.power.supply.supplies.life test.

Bilt is the modular test system whose primary application is to generate high quality programmable power supplies for test benches. batteries test bench. battery test bench. connector test bench. stress bench.laser diode

Bilt est un systeme de test modulaire dont la premiere vocation est la generation de signaux d'alimentation programmables de qualite pour les bancs de test. banc de test de batterie. banc de test de connecteur. banc de stress. banc de vieillissement.test de diode laser

itest / bilt - BE510 DC power supply for ATE burn-in life-test : 80W, multi range programmable power supply (DC source) with linear output stage : +/- 20 Volts, up to 4A

itest / bilt - BE510 : 80W, alimentation programmable continue (source DC) avec étage de sortie linéaire : +/- 20 Volts, jusqu'à 4A

itest / bilt - BE52x DC power supply for ATE burn-in life-test : 90W multi range programmable power supply (DC source) with linear output stage : up to +/- 500 Volts, up to 3A

itest / bilt - BE52x : 90W alimentation programmable continue (source DC) avec étage de sortie linéaire : jusqu'à +/- 500 Volts, jusqu'à 3A

itest / bilt - BE53x DC power supply for ATE burn-in life-test : 120W programmable power supply (DC source) with switching output stage : up to +/- 500 Volts, up to 10A

itest / bilt - BE53x : 120W alimentation programmable continue (source DC) avec étage de sortie à découpage : jusqu'à +/- 500 Volts, jusqu'à 10A

itest / bilt - BE580 DC power supply for ATE burn-in life-test : 8 channel programmable power supply (DC source) with linear output stage : +/- 15 Volts, +/-200mA

itest / bilt - BE580 : alimentation programmable continue (source DC) 8 voies avec étage de sortie linéaire : +/- 15 Volts, +/-200mA

itest / bilt - BE420 temperature controler for ATE burn-in life-test : Temperature measurement and regulation with K sensor

itest / bilt - BE420 contrôleur de temperature : mesure et régulation de température sur capteur type K

itest / bilt - BE422 temperature controler for ATE burn-in life-test : Temperature measurement and regulation with PT sensor

itest / bilt - BE422 contrôleur de temperature : mesure et régulation de température sur capteur type PT

integrated systems for Burn-In and Life-Test of electronics'components...

Modular High Quality Power Supplies for GPIB (IEEE488) / SCPI test benches (ATE)...

High quality desktop power supply... Specific and autonomous test benches...

A range of additional modules includes functions as different as temperature acquisition, relay commands, pattern generation ...

Active burn-in lifetest, generation of stimuli, protocols, clock ...Specific devellopements for SCPI / GPIB (IEEE488) applications (ATE) ...

Bilt is a modular test system (modular programmable power supply) for test bench to burn-in life-test and stress of electronic device as discrete semiconductor (semi-conductor), relay connector battery contact or laser diode or complex component with pattern or clock generator. The system can be completed by oven or micro-oven or thermal socket for cooling or heating configuration. The quality of power supply and programmable temperature controller permit you to test your component in the better condition. In addition to programmable power supply, we propose temperature module for control an measure of temperature of the test. This include peltier (or TEC controller : thermoelectric controller) module with PID regulation for fine cooling and heating systems. Is the better way to test yours discrete semiconductors (semi-conductors), relays, connectors, batteries contacts, or laser diodes. With these programmable power supply, temperature controller (oven, socket cooler / heater with peltier, TEC, PID regulation), pattern or clock generator... Bilt is the best system for life-test and burn-in application for electronic device.

Bilt est le systeme de test ideal pour le test en duree de vie de composants electroniques tel que semi-conducteur discrets, batterie, contact, relais, diode laser. Outre les alimentations programmables vous trouverez des modules pour la mesure et le controle de température (regulateur PID pour effet peltier), etuve amenagee, mico-etuve, support de test chauffant refroidissant, generateur de pattern, d'horloge... C'est le meilleur systeme pour des essais en duree de vie de composant electronique.

Bilt.iTest.easystress.ATE.programmable power supply.programmable power supplies.alimentation programmable.alimentations programmables.GPIB.SCPI.stress.burnin.burn-in.lifetest.life-test.etuve.etuves.power.supply.supplies.life test. Bilt is the modular test system whose primary application is to generate high quality programmable power supplies for test benches. batteries test bench. battery test bench. connector test bench. stress bench.laser diode Bilt est un systeme de test modulaire dont la premiere vocation est la generation de signaux d'alimentation programmables de qualite pour les bancs de test. banc de test de batterie. banc de test de connecteur. banc de stress. banc de vieillissement.test de diode laser itest / bilt - BE510 DC power supply for burn-in life-test ATE : 80W, multi range programmable power supply (DC source) with linear output stage : +/- 20 Volts, up to 4A itest / bilt - BE510 : 80W, alimentation programmable continue (source DC) avec étage de sortie linéaire : +/- 20 Volts, jusqu'à 4A itest / bilt - BE52x DC power supply for burn-in life-test ATE : 90W multi range programmable power supply (DC source) with linear output stage : up to +/- 500 Volts, up to 3A itest / bilt - BE52x : 90W alimentation programmable continue (source DC) avec étage de sortie linéaire : jusqu'à +/- 500 Volts, jusqu'à 3A itest / bilt - BE53x DC power supply for burn-in life-test ATE : 120W programmable power supply (DC source) with switching output stage : up to +/- 500 Volts, up to 10A itest / bilt - BE53x : 120W alimentation programmable continue (source DC) avec étage de sortie à découpage : jusqu'à +/- 500 Volts, jusqu'à 10A itest / bilt - BE580 DC power supply for burn-in life-test ATE : 8 channel programmable power supply (DC source) with linear output stage : +/- 15 Volts, +/-200mA itest / bilt - BE580 : alimentation programmable continue (source DC) 8 voies avec étage de sortie linéaire : +/- 15 Volts, +/-200mA itest / bilt - BE420 temperature controler for burn-in life-test ATE : Temperature measurement and regulation with K sensor itest / bilt - BE420 contrôleur de temperature : mesure et régulation de température sur capteur type K itest / bilt - BE422 temperature controler for burn-in life-test ATE : Temperature measurement and regulation with PT sensor itest / bilt - BE422 contrôleur de temperature : mesure et régulation de température sur capteur type PT integrated systems for Burn-In and Life-Test of electronics'components... Modular High Quality Power Supplies for GPIB (IEEE488) / SCPI test benches (ATE)... High quality desktop power supply... Specific and autonomous test benches... A range of additional modules includes functions as different as temperature acquisition, relay commands, pattern generation ... Active burn-in life-test, generation of stimulus, protocols, clock ...Specific devellopements for SCPI / GPIB (IEEE488) applications (ATE) ...

Bilt is a modular test system (modular programmable power supply) for test bench to burn-in life-test and stress of electronic device as discrete semiconductor (semi-conductor), relay connector battery contact or laser diode or complex component with pattern or clock generator. The system can be completed by oven or micro-oven or thermal socket for cooling or heating configuration. The quality of power supply and programmable temperature controller permit you to test your component in the better condition. In addition to programmable power supply, we propose temperature module for control an measure of temperature of the test. This include peltier (or TEC controller : thermoelectric controller) module with PID regulation for fine cooling and heating systems. Is the better way to test yours discrete semiconductors (semi-conductors), relays, connectors, batteries contacts, or laser diodes. With these programmable power supply, temperature controller (oven, socket cooler / heater with peltier, TEC, PID regulation), pattern or clock generator... Bilt is the best system for life-test and burn-in application for electronic device.

Bilt est le systeme de test ideal pour le test en duree de vie de composants electroniques tel que semi-conducteur discrets, batterie, contact, relais, diode laser. Outre les alimentations programmables vous trouverez des modules pour la mesure et le controle de température (regulateur PID pour effet peltier), etuve amenagee, mico-etuve, support de test chauffant refroidissant, generateur de pattern, d'horloge... C'est le meilleur systeme pour des essais en duree de vie de composant electronique.

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