BA2531 – Pulsed Voltage Source +120V +33A
The BA2531 is ideal for life testing and basic characterization of RF transistors. It allows a pulse between ground and a programmable level, and voltage and current measurements for both levels.
Showing all 15 results
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BE2141 – Voltage Source: ±12V ±15mA, 4 output channels
The BE2141 voltage source is a high-end bipolar voltage source developed for research applications requiring extremely low noise and/or high resolution and stability (quantum computing, nanotechnology, low-noise amplifiers, etc.). Co-created with the CNRS, the BE2141 can be transformed into a current source to power, for example, a superconducting magnet or any other component that drives current.
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BE2231 – Voltage Source: ±50V ±500mA, one output channel
Our BE2231 voltage source is designed to supply noise-sensitive components whatever the field of activity
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BE2431 – Isolated Voltage Source +120V 5A
BE2431 is a general purpose power supplies wich is also suitable for testing highly capacitive loads (e.g., pulsed transistor testing in conjunction with the BA2531).
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BE2501 – Pulsed Voltage Source ±25V ±200mA
The BE2501 is a low voltage and low current pulsed voltage source. It is well suited to drive the gate of a transistor.
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BE516 – Multirange Voltage Source ±20V ±6A
BE516 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of applications. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 6A)
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BE517 – Voltage Source +120V 4A
BE517 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of uses. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 4A)
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BE5391 – Voltage Source: +1,5kV 10mA, 3 output channels
BE5391 is a general purpose high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of high voltage transistors (e.g. SiC or GaN).
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BE547 – Voltage Source: +15V 12A
Its a general purpose which is perfect for reliability testing of high current and low voltage electronic components.
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BE582 – Voltage Source: ±10V 1A, 6 channels
BE582 is particularly suitable to test low-power components, either components requiring multiple power supplies, either to test large number of components. This unbeatable solution makes it possible to benefits a large number of channels (up to 84) in a single equipment (BiLT chassis).
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BE584x – Voltage Source: ±15V 200mA/2mA or 100µA and 10mA, 6 channels
BE584x is particularly suitable to test low-power components, either components requiring multiple power supplies, either to test large number of components. This unbeatable solution makes it possible to benefits a large number of channels in a single equipment (BiLT chassis).
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BE5880 – Voltage Source: +18V 6A, 4 output channels
Our 4-channel DC voltage source offers a high power density. Interesting for high power electronic component reliability tests, combining an attractive cost and good power density. BE5880 is also suitable for laboratories.
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BE586 – Voltage Source: ±120V 200mA/2mA, 3 channels
BE586 is a general pupose high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of hight voltage transistors (e.g. SiC or GaN)
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BE587 – Voltage Source: ±250V 1mA, 4 channels
BE587 is a high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of hight voltage transistors (e.g. SiC or GaN)
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BE5151 – Voltage Source: ±40V 0.2A, multi-range
BE5151 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of applications. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 0.2A)