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The BA2531 is ideal for life testing and basic characterization of RF transistors. It allows a pulse between ground and a programmable level, and voltage and current measurements for both levels.
The BE2501 is a low voltage and low current pulsed voltage source. It is well suited to drive the gate of a transistor.
Dedicated to reliability labs, this module allows to integrate any remotely controllable device measurement into standard BILT memories.