BE5391 – Voltage Source: +1,5kV 10mA, 3 output channels
The BE5391 is a multi-channel high-voltage source designed for reliability and life testing of high-voltage devices.
It is particularly suited for applications such as High Temperature Reverse Bias (HTRB) testing of SiC and GaN power transistors, where stable and well-controlled bias conditions are required.
Description
The BE5391 is a general-purpose high-voltage source module integrating three isolated output channels in a single BiLT® System board.
Each channel provides a programmable output voltage up to 1500 V with a current capability of 10 mA, enabling simultaneous testing of multiple devices or bias points within the same test setup.
The module is designed to meet the requirements of reliability and lifetime testing of high-voltage semiconductor devices, including SiC and GaN power transistors.
It supports applications such as High Temperature Reverse Bias (HTRB) testing, where long-term stability, controlled voltage ramps, and accurate current monitoring are critical.
The BE5391 offers programmable voltage slopes, current compliance limits, and high-resolution voltage and current read-back, ensuring precise control of stress conditions throughout the test duration.
Integrated protection features, including interlock input, channel-state monitoring, and tolerance to short-circuits up to 1500 V, contribute to safe and reliable operation in automated test environments.
When used within a BiLT® chassis, the BE5391 can be easily integrated into scalable and synchronized test systems, making it well suited for high-density reliability test benches.
