BA2531 – Pulsed Voltage Source +120V +33A
The BA2531 is ideal for life testing and basic characterization of RF transistors. It allows a pulse between ground and a programmable level, and voltage and current measurements for both levels.
Showing all 15 results


The BA2531 is ideal for life testing and basic characterization of RF transistors. It allows a pulse between ground and a programmable level, and voltage and current measurements for both levels.

Four independent ±12V / ±15mA voltage sources with 21-bit resolution and <5 µV peak-to-peak noise.
Designed for ultra-low-noise and high-stability applications.

The BE2231 is an isolated 4-quadrant DC voltage source delivering up to ±50 V / ±500 mA.
Combining ultra-low noise, high resolution, and integrated measurement capability, it is ideal for
sensitive applications such as semiconductor testing and nanodevice characterization.


The BE243x is an isolated 2-quadrant modular DC voltage source delivering up to +120V / 5A.
It combines high resolution, low noise, and fast response time, ensuring safe and stable operation
for both static and pulsed current applications.


The BE2501 is a low voltage and low current pulsed voltage source. It is well suited to drive the gate of a transistor.

The BE516 is a multi-range DC voltage source, ideal for creating test benches for electronic components. Its multiple ranges make it suitable for many different applications. Designed as a cost-effective solution, it allows accurate current measurements from just a few microamps up to 6 amps.

BE517 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of uses. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 4A)

BE5391 is a general purpose high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of high voltage transistors (e.g. SiC or GaN).

The BE547 is a general-purpose unipolar DC source, ideal for reliability testing of high-current and low-voltage electronic components.
Compact, accurate and fast, it delivers up to 15V / 12A (120W) with excellent stability and low noise.


BE582 is particularly suitable to test low-power components, either components requiring multiple power supplies, either to test large number of components. This unbeatable solution makes it possible to benefits a large number of channels (up to 84) in a single equipment (BiLT chassis).


BE584x is particularly suitable to test low-power components, either components requiring multiple power supplies, either to test large number of components. This unbeatable solution makes it possible to benefits a large number of channels in a single equipment (BiLT chassis).

The BE5880 is a 4-channel DC voltage source delivering up to +18 V / 6 A per channel.
Compact, stable, and fast, it offers an efficient solution to replace multiple bench power supplies
for laboratory and burn-in applications.

BE586 is a general pupose high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of hight voltage transistors (e.g. SiC or GaN)

BE587 is a high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of hight voltage transistors (e.g. SiC or GaN)

BE5151 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of applications. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 0.2A)