BE2800 & BE2801 – Current Source: ±6A 20V, one output channel
Very low-noise bipolar Magnet or Diode Power supply for the most demanding applications: particle accelerators, reliability test of laser diodes…
This best-seller bipolar current source module is the right choice for demanding applications. It can be used as a Magnet power supply (up to 10H) or a Diode power supply.
Thanks to ITEST deep expertise in low-noise analog electronics, this power supply offers the best noise performances available on the market: 18ppm peak to peak (10Hz-10kHz).
Outstanding current stability can be achieved thanks to a unique proprietary current measurement scheme, avoiding the use of expensive and bulky DCCTs:
– BE2800 model: 20 ppm over 24 hours
– BE2801 model: 3 ppm over 24 hours
Exceptional 1.000.000 hours field proven MTBF decreases maintenance costs and suppress the need for redundancy in critical applications, such as particle accelerators.
Several power supplies can be synchronized by different means: hardware trigger input, software trigger, UDP broadcasting.
The best companion to host this module is the BiLT 19” chassis. This 4U-high chassis can be populated with up to 14 current source modules, offering an unrivaled power supply density that will always fit in existing cabinets. The chassis modern and robust Ethernet Controller operates 24/7 for years without fault.
Like all other ITEST products, this module can be customized to the need, including improved performances. Do not hesitate to contact us.
Download the product’s datasheet to get the complete product specification.
- 6A 20V bipolar Current source
- Drives Magnets from 0H to 10H, or diodes
- Up to 21-bit programming resolution
- Very low 18ppm noise peak-to-peak
- Stability down to 3ppm for 24 hours
- TCR down to 2ppm/°C
- Proven MTBF: 1 million hours
- Beam correction in scientific or medical particle accelerators
- Low noise supply for superconducting coils
- Supply of alignment coils in Scanning Electron Microscopes
- Stable Laser or Power Diodes biasing in reliability test benches