BE587 – Voltage Source: ±250V 1mA, 4 channels
BE587 is a high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of hight voltage transistors (e.g. SiC or GaN)
BE587 is a high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of hight voltage transistors (e.g. SiC or GaN)
